AFM expands 3D capabilities
AFM expands 3D capabilities to a sub-nanometer range up to a single angstrom, including laterally, which is not reachable with any optical technique.
When measuring the direct physical wavelength linked to a specific height, NANOVEA profilometers provide unparalleled accuracy of surface measurements on any material.
And the high-speed sensors, available on the system, can do this up to 200 times faster.
No algorithms. Seamless. Without wasting time.